DefectFill: Realistic Defect Generation with Inpainting Diffusion Model for Visual Inspection
Jaewoo Song, Daemin Park, Kanghyun Baek, Sangyub Lee, Jooyoung Choi, Eunji Kim, Sungroh Yoon, in Proceedings of Conference on Computer Vision and Pattern Recognition (CVPR), Highlight Presentation, Nashville, USA, June 2025. paperlinkarXiv