Category / Sungroh Yoon
Clinical Bioimaging and Functional Genomics
Elisa Ficarra, Sungroh Yoon, Luca Benini, Enrico Macii and Giovanni De Micheli, in Proceedings of I FIMA International Conference on Models and Methods for Human Genomics, Ayas-Champoluc, Aosta Valley, Italy, January 2006.
Bioimaging and Functional Genomics
Elisa Ficarra, Giovanni De Micheli, Sungroh Yoon, Luca Benini and Enrico Macii, in Proceedings of pHealth 2006, International Workshop on Wearable Micro- and Nanosystems for Personalized Health, Luzern, Switzerland, January 2006.
A Pattern Mining Method for High-throughput Lab-on-a-chip Data Analysis
Sungroh Yoon, Luca Benini and Giovanni De Micheli, in Krishnendu Chakrabarty and Jun Zeng, Editors, Design Automation Methods and Tools for Microfluidics-Based Biochips, Springer-Verlag, New York, 2006.
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Discovering Coherent Biclusters from Gene Expression Data Using Zero-suppressed Binary Decision Diagrams
Sungroh Yoon, Christine Nardini, Luca Benini and Giovanni De Micheli, IEEE/ACM Transactions on Computational Biology and Bioinformatics, vol. 2, no. 4, pp. 339-354, October-December 2005.
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Prediction and Analysis of Human microRNA Regulatory Modules
Sungroh Yoon and Giovanni De Micheli, in Proceedings of IEEE 27th Annual International Conference of IEEE Engineering in Medicine and Biology, pp. 4799-4802, Shanghai, China, September 2005.
Finding Co-clusters of Genes and Clinical Parameters
Sungroh Yoon, Luca Benini and Giovanni De Micheli, in Proceedings of IEEE 27th Annual International Conference of IEEE Engineering in Medicine and Biology, pp. 906-912, Shanghai, China, September 2005.
An Application of Zero-suppressed Binary Decision Diagrams to Clustering Analysis of DNA Microarray Data
Sungroh Yoon and Giovanni De Micheli, in Proceedings of IEEE 26th Annual International Conference of IEEE Engineering in Medicine and Biology, pp. 2925-2928, San Francisco, USA, September 2004.
Enhanced pClustering and Its Applications to Gene Expression Data
Sungroh Yoon, Christine Nardini, Luca Benini and Giovanni De Micheli, in Proceedings of IEEE 4th Symposium on Bioinformatics and Bioengineering, pp. 275-282, Taichung, Taiwan, May 2004.
Defects vs. Faults: Some Data from the ELF35 and Murphy Chips
Edward J. McCluskey, Ahmad Al-Yamani, James Chien-mo Li, Chao-wen Tseng, Erik Volkerink, Sungroh Yoon, Francois-Fabien Ferhani, Edward Li and Subhasish Mitra, Center for Reliable Computing Technical Report, Stanford University, October 2002.