Publications
Publications
Defects vs. Faults: Some Data from the ELF35 and Murphy Chips
Edward J. McCluskey, Ahmad Al-Yamani, James Chien-mo Li, Chao-wen Tseng, Erik Volkerink, Sungroh Yoon, Francois-Fabien Ferhani, Edward Li and Subhasish Mitra, Center for Reliable Computing Technical Report, Stanford University, October 2002.
Testable Design of ELF13: 0.13μm Digital CMOS Circuits
Sungroh Yoon, James Chien-mo Li and Edward J. McCluskey, Center for Reliable Computing Technical Report, Stanford University, May 2002.
03 May 2002