Publications

Publications

Defects vs. Faults: Some Data from the ELF35 and Murphy Chips

Edward J. McCluskey, Ahmad Al-Yamani, James Chien-mo Li, Chao-wen Tseng, Erik Volkerink, Sungroh Yoon, Francois-Fabien Ferhani, Edward Li and Subhasish Mitra, Center for Reliable Computing Technical Report, Stanford University, October 2002.

03 October 2002
Ahmad Al-Yamani, Chao-wen Tseng, Edward J. McCluskey, Edward Li, Erik Volkerink, Francois-Fabien Ferhani, James Chien-mo Li, Others, Subhasish Mitra, Sungroh Yoon

Testable Design of ELF13: 0.13μm Digital CMOS Circuits

Sungroh Yoon, James Chien-mo Li and Edward J. McCluskey, Center for Reliable Computing Technical Report, Stanford University, May 2002.

03 May 2002
Edward J. McCluskey, James Chien-mo Li, Others, Sungroh Yoon

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